Determining the Content of Silicon Dioxide in Bauxites Using X-Ray Fluorescence Spectrometry
نویسندگان
1 Department of Chemistry, Faculty of Natural Sciences and Mathematics, University of Banja Luka, Mladena Stojanovića 2, 78 000 Banja Luka, BOSNIA & HERZEGOVINA
2 Department of Chemical Technology, Faculty of Technology Zvornik, University of East Sarajevo, Karakaj bb, 75 400 Zvornik, BOSNIA & HERZEGOVINA
3 Аcademy of Sciences and Arts of Republic of Srpska, Bana Lazarevića 1, 78 000 Banja Luka, BOSNIA & HERZEGOVINA
4 Department of Chemical Technology, Faculty of Technology Banja Luka, University of Banja Luka, Vojvode Stepe Stepanovića 73, 78 000 Banja Luka, BOSNIA & HERZEGOVINA
5 Department of Chemical Technology, Faculty of Technology Zvornik, University of East Sarajevo, Karakaj bb, 75 400 Zvornik, BOSNIA & HERZEGOVINA
6 Alumina Factory "Alumina” Zvornik, Karakaj, 75 400 Zvornik, BOSNIA & HERZEGOVINA
doi
10.30492/ijcce.2019.34231چکیده
The X-ray fluorescence spectrometry and the MA.BM.006 reference spectrophotometric methods were used to determine the content of SiO2 (%) in bauxites from different deposits. The treatment of samples prior to the analysis involved the following steps: annealing, melting using the borax method, and the formation of beads. Certified reference bauxite samples were used for the calibration curve. The calibration curve was produced with the correlation coefficient of r =0.9999 and the standard error of S = 0.0246. The average residual value between the content of SiO2 determined using the XRF method, and the reference method was 0.045, with a standard deviation of 0.068. The XRF method was statistically verified by the F- and t- tests (using the standard sample and the reference method). The values obtained in the tests show that the XRF method yields accurate results and that there are no standard errors.
