Comprehensive Evaluation of Crosstalk and Delay Profiles in VLSI Interconnect Structures with Partially Coupled Lines
نویسندگان
1 MSc Graduate, Research Assistant, School of Electrical and Computer Eng., College of Eng., University of Tehran
2 Professor,School of Electrical and Computer Eng., College of Eng., University of Tehran
doi
چکیده
In this paper, we present a methodology to explore and evaluate the crosstalk noise and the profile of its variations, and the delay of interconnects through investigation of two groups of interconnect structures in nano scale VLSI circuits. The interconnect structures in the first group are considered to be partially coupled ...
